• 1
• 74F1071
• 页
• 82K

• 2
• 74F10_11_2
• 页
• 81K

• 3
• 74F109_2
• 页
• 95K

• 4
• 74F109
• 页
• 79K

• 5
• 74F1056
• 页
• 37K

• 6
• 74f10
• 页
• 62K

• 7
• 74F10SJX
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 8
• 74F10SJX
• Fairchild Semiconductor
• Triple 3-Input NAND Gate
• 5页
• 61K

• 9
• 74F10SJCX
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 10
• 74F10SJC
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 11
• 74F10SJ
• Fairchild Semiconductor
• Triple 3-Input NAND Gate
• 5页
• 61K

• 12
• 74F10SJ
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 13
• 74F10SCX
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 14
• 74F10SCX
• Fairchild Semiconductor
• Triple 3-Input NAND Gate
• 5页
• 61K

• 15
• 74F10SC
• Fairchild Semiconductor
• Triple 3-Input NAND Gate
• 5页
• 61K

• 16
• 74F10SC
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 17
• 74F10PCX
• Fairchild Semiconductor
• Triple 3-Input NAND Gate
• 5页
• 61K

• 18
• 74F10PC
• National Semiconductor Corporation
• Triple 3-Input NAND Gate
• 6页
• 140K

• 19
• 74F10PC
• Fairchild Semiconductor
• Triple 3-Input NAND Gate
• 5页
• 61K

• 20
• 74F109SJX
• Fairchild Semiconductor
• Dual JK Positive Edge-Triggered Flip-Flop
• 7页
• 77K

• 21
• 74F109SJX
• National Semiconductor Corporation
• Dual J Inverted K Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 22
• 74F109SJCX
• National Semiconductor Corporation
• Dual JInvertedK Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 23
• 74F109SJC
• National Semiconductor Corporation
• Dual JInvertedK Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 24
• 74F109SJ
• National Semiconductor Corporation
• Dual J Inverted K Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 25
• 74F109SJ
• Fairchild Semiconductor
• Dual JK Positive Edge-Triggered Flip-Flop
• 7页
• 77K

• 26
• 74F109SCX
• National Semiconductor Corporation
• Dual J Inverted K Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 27
• 74F109SCX
• Fairchild Semiconductor
• Dual JK Positive Edge-Triggered Flip-Flop
• 7页
• 77K

• 28
• 74F109SC
• National Semiconductor Corporation
• Dual J Inverted K Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 29
• 74F109SC
• Fairchild Semiconductor
• Dual JK Positive Edge-Triggered Flip-Flop
• 7页
• 77K

• 30
• 74F109PCX
• Fairchild Semiconductor
• Dual JK Positive Edge-Triggered Flip-Flop
• 7页
• 77K

• 31
• 74F109PC
• Fairchild Semiconductor
• Dual JK Positive Edge-Triggered Flip-Flop
• 7页
• 77K

• 32
• 74F109PC
• National Semiconductor Corporation
• Dual J Inverted K Positive Edge-Triggered Flip-Flop
• 10页
• 133K

• 33
• 74F1071SCX
• Fairchild Semiconductor
• 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
• 6页
• 81K

• 34
• 74F1071SC
• Fairchild Semiconductor
• 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
• 6页
• 81K

• 35
• 74F1071MTCX
• Fairchild Semiconductor
• 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
• 6页
• 81K

• 36
• 74F1071MTC
• Fairchild Semiconductor
• 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
• 6页
• 81K

• 37
• 74F1071MSAX
• Fairchild Semiconductor
• 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
• 6页
• 81K

• 38
• 74F1071MSA
• Fairchild Semiconductor
• 18-Bit Undershoot/Overshoot Clamp and ESD Protection Device
• 6页
• 81K

• 39
• 74F1056SCX
• Fairchild Semiconductor
• 8-Bit Schottky Barrier Diode Array
• 4页
• 35K

• 40
• 74F1056SC
• Fairchild Semiconductor
• 8-Bit Schottky Barrier Diode Array
• 4页
• 35K

• 41
• 74F10
• Philips Semiconductors
• Triple 3-input NAND gate
• 8页
• 81K

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